Block Test Gratings for Z-axis PeakForce Tapping Enabled Bruker AFM DDFMLSP DESCRIPTION

Name: Block Test Gratings for Z-axis PeakForce Tapping Enabled Bruker AFM DDFMLSP DESCRIPTION
Brand: kozanlarjeotermal.com.tr
SKU: 21706012512
Price: 213.22 USD
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SKU: 21706012512

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USD213.22 USD235.22

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Description

DDFMLSP DESCRIPTION

electrically conductive tip

High quality glass

NanoScope IV

Block Test Gratings for Z-axis PeakForce Tapping Enabled Bruker AFM DDFMLSP DESCRIPTIONDESCRIPTION Selection of 3 block type test gratings with different step heights intended for Z axis calibration of scanning probe microscopes and linearity measurements. Structure: Si Wafer with SiO2 layer for grating Pattern type: 1 Dimensional (in Z axis direction) Step heights: 201. 5nm for TGZ 20 1102nm for TGZ 100 5203nm for TGZ 500 Period: 3 0. 01m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 3 x 3mm Note: Values for step heights

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